Spherical crystal imaging spectrometer /SCIS/ for cosmic X-ray spectroscopy

Details Spherical crystal imaging spectrometer /SCIS/ for cosmic X-ray spectroscopy Spherical crystal imaging spectrometer /SCIS/ for cosmic X-ray spectroscopy

Oct 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980apopt..19.3306s&link_type=abstract

Applied Optics, vol. 19, Oct. 1, 1980, p. 3306-3312. Research supported by the Smithsonian Institution.

Physics

Optics

3

Cosmic X Rays, Crystal Optics, Spaceborne Astronomy, X Ray Astronomy, X Ray Spectroscopy, Bragg Angle, Continuous Radiation, Position Errors, Sensitivity, Spacelab Payloads, Spectral Resolution

Scientific paper

The application of a spherically bent crystal X-ray spectrometer to cosmic X-ray problems is discussed. This is the only geometry whose diffraction properties are preserved under all rotations of the spacecraft. The combination of Bragg reflection and spherical aberration provides for stigmatic imaging of extended sources and minimum spatial and/or spectral resolution loss arising from source extent and spacecraft pointing errors. The sensitivity of the instrument is discussed in the context of a Spacelab mission.

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