SIM external metrology beam launcher (QP) development

Details SIM external metrology beam launcher (QP) development SIM external metrology beam launcher (QP) development

Feb 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4852..347a&link_type=abstract

Interferometry in Space. Edited by Shao, Michael. Proceedings of the SPIE, Volume 4852, pp. 347-354 (2003).

Physics

Scientific paper

Visible interferometry at µarc-second accuracy requires measurement of the interferometric baseline length and orientation at picometer accuracy. The optical metrology instruments required for these interferometers must achieve accuracy on order of 1 to 10 picometers. This paper discusses the progress in the development of optical interferometers for use in distance measurement gauges with systematic errors below 100 picometers. The design is discussed as well as test methods and test results.

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