STIS Sparse Field CTE test

Details STIS Sparse Field CTE test STIS Sparse Field CTE test

Dec 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997hst..prop.7944g&link_type=abstract

HST Proposal ID #7944

Physics

Hst Proposal Id #7944

Scientific paper

CTE measurements are made using the "sparse field test", along both the
serial and parallel axes. This program needs special commanding to
provide {a} off-center MSM positionings of some slits, and {b} the
ability to read out with any amplifier {A, B, C, or D}. All exposures
are internals.

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