Relationship between Critical Current Fluctuation of Superconducting Bicrystal Junction and Junction Parameters

Details Relationship between Critical Current Fluctuation of Superconducting Bicrystal Junction and Junction Parameters Relationship between Critical Current Fluctuation of Superconducting Bicrystal Junction and Junction Parameters

Apr 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999jajap..38l.433e&link_type=abstract

Japanese Journal of Applied Physics, Volume 38, Issue 4B, pp. L433-L435 (1999).

Physics

2

Scientific paper

Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T=77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross [Appl. Phys. Lett. 70, 120 (1997)] and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.

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