Physics
Scientific paper
Jul 1991
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1447..123a&link_type=abstract
Proc. SPIE Vol. 1447, p. 123-139, Charge-Coupled Devices and Solid State Optical Sensors II, Morley M. Blouke; Ed.
Physics
2
Scientific paper
The charge-coupled device (CCD) camera of the Soft X-ray Telescope (SXT) for the Japanese Solar-A Mission utilizes a 1024 X 1024 virtual phase CCD manufactured by Texas Instruments in Japan. This sensor will be subject to radiation in the form of trapped protons from the earth's radiation belts and soft x-rays (0.2-4 keV) in the solar image. Proton damage produces 'dark spikes' or pixels of enhanced dark current. This can be characterized in terms of the average increase in dark current as a function of proton fluence and predicted through proton transfer calculations. During the preparation of this camera it has been discovered that exposure to soft x-rays creates 'permanent' ionization damage in the gate insulator, resulting in flat-band shift, dark current increase, loss of charge transfer efficiency, and, ultimately, total unpinning of the sensor. It has been found that ultra-violet, and to a lesser degree, visible-light flooding photo-emits free electrons into the gate oxide which 'anneals' the damage, restoring proper operation of the CCD.
Acton Loren W.
Elliott Tom S.
Janesick James R.
Morrison Mons D.
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