Observation of charge-separating defects in HgCdTe using remote contact electron beam induced current

Details Observation of charge-separating defects in HgCdTe using remote contact electron beam induced current Observation of charge-separating defects in HgCdTe using remote contact electron beam induced current

Apr 1988

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1988apphl..52.1255b&link_type=abstract

Applied Physics Letters (ISSN 0003-6951), vol. 52, April 11, 1988, p. 1255-1257.

Physics

8

Charge Transfer, Electron Beams, Infrared Detectors, Mercury Cadmium Tellurides, Band Structure Of Solids, Crystal Defects, Electric Contacts

Scientific paper

A spatially resolved electron-beam technique, remote-contact electron-beam-induced current, has been developed to detect and map charge-separating defects in HgCdTe with two remote sample contacts. This technique, characterized by spatial resolution of about 1 micron, and high sensitivity (signal/noise) to fields produced by inclusions, damage, dislocations, strain, p-n junctions, and possibly compositional (band-gap) and doping variations, shows promise for analyzing materials, passivation coatings, and diode arrays without making contacts to the individual devices.

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