Measurements of X-ray reflectivities of Au-coatings at several energies

Details Measurements of X-ray reflectivities of Au-coatings at several energies Measurements of X-ray reflectivities of Au-coatings at several energies

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1333..257h&link_type=abstract

IN: Advanced optical manufacturing and testing; Proceedings of the Meeting, San Diego, CA, July 9-11, 1990 (A92-17451 05-74). Be

Physics

Gold Coatings, Reflectance, X Ray Telescopes, Aluminum, Metal Foils, Scanning Tunneling Microscopy, Surface Roughness

Scientific paper

The results of an extensive study of X-ray reflectivities of dip lacquered and Au-coated Al foils are presented. The measurements are performed at four different energies from 0.71 keV to 8.1 keV. The foils span a range of fabrication parameters. It is shown that two of three examined versions of a density variation model are able to explain the data. A strong dependence on the microroughness of thickness of the Au coating and of the Au deposition rates is found. Data suggesting an important correspondence between X-ray measurements and scanning tunneling microscopy measurements are presented. Finally, an energy scan of one of the foils, in the range 6 keV to 12 keV, was performed.

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