Surficial Contamination on Genesis Flight Silicon on Sapphire (SoS) Wafer Fragments and Its Implication to the Determination of Solar Wind Tracers

Details Surficial Contamination on Genesis Flight Silicon on Sapphire (SoS) Wafer Fragments and Its Implication to the Determination of Solar Wind Tracers Surficial Contamination on Genesis Flight Silicon on Sapphire (SoS) Wafer Fragments and Its Implication to the Determination of Solar Wind Tracers

Mar 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008lpi....39.1976h&link_type=abstract

39th Lunar and Planetary Science Conference, (Lunar and Planetary Science XXXIX), held March 10-14, 2008 in League City, Texas.

Physics

3

Scientific paper

Surficial contamination on the Genesis wafers have been characterized by
analyzing most elements in the periodic table. The target elements have
been selected for high precision solution-ICP-MS analysis of solar wind
tracers.

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