STIS Sparse Field CTE test-internal {Cycle 11}

Details STIS Sparse Field CTE test-internal {Cycle 11} STIS Sparse Field CTE test-internal {Cycle 11}

Jul 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002hst..prop.9620g&link_type=abstract

HST Proposal ID #9620

Physics

Hst Proposal Id #9620

Scientific paper

CTE measurements are made using the "internal sparse field test", along
the parallel axis. The new "POS=" optional parameter is used to provide
off-center MSM positionings of some slits. All exposures are internals.

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