Photodetachment Microscope with Repulsive Coulomb Field

Details Photodetachment Microscope with Repulsive Coulomb Field Photodetachment Microscope with Repulsive Coulomb Field

2011-11-06

arxiv.org/abs/1111.1408v1

Physics

Instrumentation and Detectors

12 pages, 5 figures

Scientific paper

Investigation of electronic waves with high coherence in photodetachment of a negative ion gives a physical basis to develop the holographic electronic microscopy with high resolution. The interference pattern is considered in the framework of steady-state wave approach. In semiclassical approximation, an outgoing wave is described by the amplitude slowly varying along a trajectory. Quantum description of electron photodetachment from negative ion is formulated with the help of the inhomogeneous Schr\"odinger equation. Its asymptotic solution is expressed in terms of the Green function that has exact expression for the homogeneous electric field and the Coulomb field. It is demonstrated that repulsive Coulomb field is effective for magnification of the interference pattern at a short distance from an ion. For the first time, as shown for this case, the interference pattern in asymptotic area can be calculated by means of global semiclassical approximation or, a little more roughly, by simple uniform field approximation. New proposals and possible parameters for experimental measurement scheme for the effect are discussed.

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