Measurement of the $B^{0}_{s}$ Lifetime Using Semileptonic Decays

Details Measurement of the $B^{0}_{s}$ Lifetime Using Semileptonic Decays Measurement of the $B^{0}_{s}$ Lifetime Using Semileptonic Decays

2006-04-24

arxiv.org/abs/hep-ex/0604046v2

Phys.Rev.Lett.97:241801,2006

Physics

High Energy Physics

High Energy Physics - Experiment

To appear in Phys. Rev. Lett., 7 pages, 2 figures

Scientific paper

10.1103/PhysRevLett.97.241801

We report a measurement of the $B^0_{s}$ lifetime in the semileptonic decay channel $B^0_{s}\to D^-_s \mu^{+}\nu X$ (and its charge conjugate), using approximately 0.4 fb$^{-1}$ of data collected with the D0 detector during 2002 -- 2004. We have reconstructed 5176 $D^-_s \mu^{+}$ signal events, where the $D_s^-$ is identified via the decay $D_s^-\to \phi\pi^-$, followed by $\phi\to K^+ K^-$. Using these events, we have measured the $B^0_s$ lifetime to be $\tau(B^0_{s}) = 1.398 \pm 0.044$ $({stat}) ^{+0.028}_{-0.025}$ $({syst}) {ps}$. This is the most precise measurement of the $B_s^0$ lifetime to date.

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