SOC Testing Methodology and Practice

Details SOC Testing Methodology and Practice SOC Testing Methodology and Practice

2007-10-25

arxiv.org/abs/0710.4669v1

Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Computer Science

Hardware Architecture

Submitted on behalf of EDAA (http://www.edaa.com/)

Scientific paper

On a commercial digital still camera (DSC) controller chip we practice a novel SOC test integration platform, solving real problems in test scheduling, test IO reduction, timing of functional test, scan IO sharing, embedded memory built-in self-test (BIST), etc. The chip has been fabricated and tested successfully by our approach. Test results justify that short test integration cost, short test time, and small area overhead can be achieved. To support SOC testing, a memory BIST compiler and an SOC testing integration system have been developed.

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