Multipartite entanglement and high precision metrology

Details Multipartite entanglement and high precision metrology Multipartite entanglement and high precision metrology

2010-06-22

arxiv.org/abs/1006.4368v2

Phys. Rev. A 85, 022322 (2012)

Physics

Quantum Physics

10 pages including 3 figures, revtex4; v2: typos corrected, explanation extended, published version. An independent work by Ph

Scientific paper

10.1103/PhysRevA.85.022322

We present several entanglement criteria in terms of the quantum Fisher information that help to relate various forms of multipartite entanglement to the sensitivity of phase estimation. We show that genuine multipartite entanglement is necessary to reach the maximum sensitivity in some very general metrological tasks using a two-arm linear interferometer. We also show that it is needed to reach the maximum average sensitivity in a certain combination of such metrological tasks.

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