Optical element for X-ray microscopy

Details Optical element for X-ray microscopy Optical element for X-ray microscopy

2008-09-30

arxiv.org/abs/0809.5160v1

Physics

Optics

8 pages, 4 figures

Scientific paper

We present a proposal for a X-ray optical element suitable for X-ray
microscopy and other X-ray-based display systems. Its principle is based on the
Fresnel lenses condition and the Bragg condition for X-ray scattering on a
slice of monocrystal. These conditions are fulfilled simultaneously due to a
properly machined shape of the monocrystal with a stress at its ends.

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