Hydrogen analysis in quartz crystals and quartz glasses by secondary ion mass spectrometry

Physics

Scientific paper

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Scientific paper

Microanalysis of hydrogen in quartz crystals and quartz glasses has been developed by secondary ion mass spectrometry (SIMS). The secondary ion intensities of hydrogen are proportional to the hydrogen contents determined by infrared (IR) absorption over the range of 5 to 3000 ppma H/Si. The correlation between SIMS and IR results indicates that secondary ion yields of hydrogen are independent of crystal structure. This SIMS method could reveal correlations between hydrogen distribution and hydrolytic weakening at the microscopic level.

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