Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Details Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS

Nov 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2863..222b&link_type=abstract

Proc. SPIE Vol. 2863, p. 222-226, Current Developments in Optical Design and Engineering VI, Robert E. Fischer; Warren J. Smith;

Physics

Scientific paper

The optical design of a breadboard high resolution infrared spectrometer for the IRS instrument on the SIRTF mission is discussed. The spectrometer uses a crossed echelle grating configuration to cover the spectral region from 10 to 20 micrometer with a resolving power of approximately equals 600. The all reflective spectrometer forms a nearly diffraction limited image of the two dimensional spectrum on a 128 multiplied by 128 arsenic doped silicon area array with 75 micrometer pixels. The design aspects discussed include, grating numerology, image quality, packaging and alignment philosophy.

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