Radiation effects on spatial dark current fluctuations in charge coupled devices (CCDs) image sensors

Physics – Optics

Scientific paper

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Scientific paper

Results on spatial dark current fluctuations in Thomson TH7863 CCD image sensor are presented. The fluctuations have been investigated after irradiations by (superscript 90)Sr and neutrons (1 MeV) sources. Both ionization and bulk displacement damage are considered. Measured data are compared to predicted values calculated using extreme value statistical analysis. An excellent agreement is found for neutron-induced dark current fluctuations. In contrast, the case of dose-induced dark current fluctuations is more difficult to interpret owing to the lack of an adequate model for interface- state buildup. However, particle-induced damage appears to be the most important contribution to the observed fluctuations. Extension of these results to other types of radiation is discussed in order to assess the radiation response of the TH7863 for a given space flight environment.

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