Development of a normal incidence multilayer, imaging X-ray microscope

Details Development of a normal incidence multilayer, imaging X-ray microscope Development of a normal incidence multilayer, imaging X-ray microscope

Jul 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1160..109s&link_type=abstract

IN: X-ray/EUV optics for astronomy and microscopy; Proceedings of the Meeting, San Diego, CA, Aug. 7-11, 1989 (A90-46006 21-74).

Physics

Optics

Laminates, X Ray Imagery, X Ray Scattering, Grazing Incidence, Laser Fusion, Microscopes, Spatial Resolution, X Ray Telescopes

Scientific paper

This paper describes the design, analysis, and fabrication of a normal-incidence multilayer 20x Schwarzschild imaging X-ray microscope. The microscope is being fabricated using much of the technology implemented in the Multispectral Solar Telescope Array. Results of diffraction analysis show that better than 400 A spatial resolution in the object plane up to a 1-mm field of view can be achieved with 125 A radiation. Other microscope systems for use in conjunction with X-ray telescopes are analyzed and designed.

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