Measurement of vectorial effects in the X-ray and UV photoemission from CsI: A novel polarimeter for soft X-ray astronomy

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Scientific paper

The current status of astronomical X-ray polarimetry is reviewed. A new class of X-ray polarimeters is proposed based on previous observations of a linear polarisation term (``vectorial effect'') in the UV and XUV quantum efficiency of microchannel plates and planar photocathodes. Results from a laboratory prototype, which utilises the linear polarisation dependence of the grazing incidence photoyield from CsI, are presented. Absolute values of the modulation contrast factor greater than 0.3 are reported (i) for spot X-ray energies between 0.165 and 2.7 keV and (ii) for a UV band centred on 8 eV. Polarisation measurements using an Al2O3 photocathode are also presented. Sources of instrumental polarisation are estimated with the aid of a Monte Carlo ray-trace model of the apparatus. The possible physical bases of the polarisation sensitivity of CsI are discussed and the sensitivity of a satellite-borne photoemission polarimeter briefly assessed.

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