New type of ellipsometry in infrared spectroscopy: The double-reference method

Details New type of ellipsometry in infrared spectroscopy: The double-reference method New type of ellipsometry in infrared spectroscopy: The double-reference method

2008-01-28

arxiv.org/abs/0801.4333v1

Physics

Optics

submitted to Appl. Phys. Lett

Scientific paper

We have developed a conceptually new type of ellipsometry which allows the determination of the complex refractive index by simultaneously measuring the unpolarized normal-incidence reflectivity relative to the vacuum and to another reference media. From these two quantities the complex optical response can be directly obtained without Kramers-Kronig transformation. Due to its transparency and large refractive index over a broad range of the spectrum, from the far-infrared to the soft ultraviolet region, diamond can be ideally used as a second reference. The experimental arrangement is rather simple compared to other ellipsometric techniques.

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