New method of measuring CCD device photoresponse nonuniformity

Details New method of measuring CCD device photoresponse nonuniformity New method of measuring CCD device photoresponse nonuniformity

Aug 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3553..295w&link_type=abstract

Proc. SPIE Vol. 3553, p. 295-296, Detectors, Focal Plane Arrays, and Imaging Devices II, Pingzhi Liang; Marc Wigdor; William G.

Physics

Scientific paper

A new method of measuring the PRN of CCD device is presented the PRN of
CCD device can be determined quickly and accurately by this method, the
effect of illuminance distribution nonuniformity on the measurement of
CCD device PRN is eliminated.

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