SEU flight data from the CRRES MEP

Details SEU flight data from the CRRES MEP SEU flight data from the CRRES MEP

Dec 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991itns...38.1647c&link_type=abstract

(1991 IEEE Annual Conference on Nuclear and Space Radiation Effects, 28th, San Diego, CA, July 15-19, 1991, Proceedings. A92-240

Physics

14

Chips (Electronics), Extraterrestrial Radiation, Flight Tests, Single Event Upsets, Spaceborne Experiments, Cosmic Rays, Earth Orbital Environments, Elliptical Orbits, Random Access Memory

Scientific paper

Analysis of single event upset data from the CRRES MEP from 27 July 1990
through 26 March 1991 has shown that upsets are being observed each
orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices,
proton upsets in the radiation belts predominate over cosmic ray upsets,
and many devices exhibit multiple bit upsets.

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