A Transmission Electron Microscopy Study of Ultramicrotomed SiC-X Grains

Details A Transmission Electron Microscopy Study of Ultramicrotomed SiC-X Grains A Transmission Electron Microscopy Study of Ultramicrotomed SiC-X Grains

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.2202h&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.2202

Physics

4

Scientific paper

We report the results of a NanoSIMS and TEM study of four SiC X-grains,
which have a supernova origin. Like mainstream SiCs, initial polytype
determinations indicate 3C-SiC is common, but with smaller domain size
and higher Mg content from decayed 26Al.

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