Trace Element Analyses of L2011 Cluster Particles with the New X-Ray Microprobe at the Advanced Photon Source

Details Trace Element Analyses of L2011 Cluster Particles with the New X-Ray Microprobe at the Advanced Photon Source Trace Element Analyses of L2011 Cluster Particles with the New X-Ray Microprobe at the Advanced Photon Source

Mar 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999lpi....30.1656s&link_type=abstract

30th Annual Lunar and Planetary Science Conference, March 15-29, 1999, Houston, TX, abstract no. 1656

Physics

1

Scientific paper

We report here our first use of the new x-ray microprobe at the Advanced
Photon Source (APS), Argonne National Laboratory, for trace element
analyses of IDPs. The APS microprobe has a sensitivity enhancement of
about a factor of 100 over the NSLS microprobe.

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