Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

Details Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations Surface Characterization of Genesis Samples by Total Reflection X-Ray Fluorescence Spectrometry: Contaminants and Roughness Variations

Mar 2011

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2011lpi....42.2041s&link_type=abstract

42nd Lunar and Planetary Science Conference, held March 7–11, 2011 at The Woodlands, Texas. LPI Contribution No. 1608, p.2041

Physics

2

Scientific paper

Surface analysis of Genesis solar wind samples by laboratory-based TXRF
in conjunction with different cleaning procedures was carried out.
Remaining contaminants and surface roughness were evaluated for
different types of collector materials.

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