Oscillator strengths in lanthanide ions: Sm II

Details Oscillator strengths in lanthanide ions: Sm II Oscillator strengths in lanthanide ions: Sm II

May 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003aps..dmp.j1165s&link_type=abstract

American Physical Society, 34th Meeting of the Division of Atomic, Molecular and Optical Physics, May 20-24, 2003, Boulder, Colo

Physics

Scientific paper

Atomic oscillator strengths are essential data for astrophysical elemental abundance studies aimed at elucidating nucleosynthesis and interior stellar dynamics. We have measured oscillator strengths in singly-ionized Sm using laser-induced fluorescence from a fast ion beam. With the laser tuned to excite a single excited state, we monitor the relative intensity of the emission branches as viewed by a grating monochromator. The efficiency for light detection as a function of wavelength is calibrated using a NIST-traceable standard lamp. The branching ratios coupled with lifetimes measured previously [1] yield the oscillator strengths. 1. T. J. Scholl, R. A. Holt, D. Masterman, R. C. Rivest, S. D. Rosner, and A. Sharikova, Can. J. Phys. 80, 1621 (2002).

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