Cooled echelle grating spectrometer

Details Cooled echelle grating spectrometer Cooled echelle grating spectrometer

May 1980

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1980nasa.reptu....b&link_type=abstract

Patent National Aeronautics and Space Administration. Pasadena Office, CA.

Physics

Echelle Gratings, Infrared Spectrometers, Schmidt Cameras, Spaceborne Telescopes, Cooling Systems, Focal Plane Devices, Gratings (Spectra), Infrared Spectra, Patents, Radiation Detectors

Scientific paper

A cooled echelle grating spectrometer for detecting wavelengths between one micron and fifteen microns is disclosed. More specifically, the spectrometer has a cross-dispersing grating for ordering infrared energy and an echelle grating for further ordering of the infrared energy. Ordered radiation from the echelle grating is sensed by a detecting means. Also disclosed is use of a Schmidt camera for focusing the further ordered radiation from the echelle grating onto a detector array having individual detectors dispersed on a plane which substantially corresponds to a curved focal plane of the Schmidt camera. A spectrometer constructed according to the teachings of the present invention will continuously cover the spectrum between one micron and fifteen microns and have a resolution of 0.1/cm.

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