Experimental Determination of the Gain Distribution of an Avalanche Photodiode at Low Gains

Details Experimental Determination of the Gain Distribution of an Avalanche Photodiode at Low Gains Experimental Determination of the Gain Distribution of an Avalanche Photodiode at Low Gains

2008-12-04

arxiv.org/abs/0812.0842v1

Physics

Quantum Physics

3 pages, 4 figures

Scientific paper

10.1109/LED.2008.2008404

A measurement system for determining the gain distributions of avalanche photodiodes (APDs) in a low gain range is presented. The system is based on an ultralow-noise charge--sensitive amplifier and detects the output carriers from an APD. The noise of the charge--sensitive amplifier is as low as 4.2 electrons at a sampling rate of 200 Hz. The gain distribution of a commercial Si APD with low average gains are presented, demonstrating the McIntyre theory in the low gain range.

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