CCD Sparse Field CTE Internal

Details CCD Sparse Field CTE Internal CCD Sparse Field CTE Internal

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008hst..prop11850w&link_type=abstract

HST Proposal ID #11850. Cycle 17

Physics

Scientific paper

CTE measurements are made using the "internal sparse field test", along
the parallel axis. The "POS=" optional parameter, introduced during
cycle 11, is used to provide off-center MSM positionings of some slits.
All exposures are internals.;

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