Optical delay tester

Details Optical delay tester Optical delay tester

Aug 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991spie.1479..283w&link_type=abstract

Proc. SPIE Vol. 1479, p. 283-290, Surveillance Technologies, Sankaran Gowrinathan; Raymond J. Mataloni; Stanley J. Schwartz; Eds

Physics

Scientific paper

The authors have developed an optical delay tester based on electro-optic sampling, and designed a prototype to test the timing of high-speed IC chips. The device puts an electro-optic crystal in contact with the terminals to be tested and measures the voltage waveform applied to the crystal. Measurement precision is 100 mV or better and timing precision measurement is 50 ps.

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