Ridged plains of Lunae Planum: Thickness distribution revised

Details Ridged plains of Lunae Planum: Thickness distribution revised Ridged plains of Lunae Planum: Thickness distribution revised

Apr 1985

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985pggp.rept..237d&link_type=abstract

In NASA, Washington Repts. of Planetary Geol. and Geophys. Program p 237-238 (SEE N85-23474 13-91)

Physics

Craters, Domes (Geology), Gaps (Geology), Mars Surface, Planetary Geology, Mapping, Structural Properties (Geology), Topography

Scientific paper

New data are used to revise the isopach of plains-forming material in the Lunae Planum region. The distribution of data points in the region has not increased; consequently, the new map is still valid for generalized thickness trends only. The isopach map is based on a total of 65 points; 32 points represent thickness estimates at partially buried craters. The remaining 33 points define the limits of plains-forming materials (zero thickness). Suitable buried craters are randomly distributed and sparse near the western edge and northern portion of the area. The overall thickness trend is similar to the previously mapped distribution, but there is a significant reduction in thickness values.

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