Low frequency flatfield test for NICMOS Camera 1

Details Low frequency flatfield test for NICMOS Camera 1 Low frequency flatfield test for NICMOS Camera 1

Jul 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005hst..prop10727d&link_type=abstract

HST Proposal ID #10727

Physics

Hst Proposal Id #10727

Scientific paper

We will perform a low frequency flatfield investigation for NICMOS Camera 1 in order to better characterize the flatfielding errors seen for camera 1 in the photometric monitoring data. NGC1850 will be dithered in a 3x3 pattern in 4 filters: F090M, F110W, F160W, and F190N. Each exposure will last at least 100 s to mitigate charge trapping non-linearity effects. Please schedule this at the earliest opportunity, as the problems with the NIC1 flat field may be related to the NICMOS non-linearity currently being investigated.

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