Solar Wind Elemental Fractionation: Genesis C and O Fluences by Backside SIMS Profiling — Preliminary Data

Details Solar Wind Elemental Fractionation: Genesis C and O Fluences by Backside SIMS Profiling — Preliminary Data Solar Wind Elemental Fractionation: Genesis C and O Fluences by Backside SIMS Profiling — Preliminary Data

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.2234h&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.2234

Physics

1

Scientific paper

We here report the first successful analyses of C and O fluences from
Genesis. Backside depth profiling with SIMS is a strong tool to detect
shallowly implanted solar wind in spite of large surface contamination.

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