STIS Sparse Field CTE test-internal {Cycle 10}

Details STIS Sparse Field CTE test-internal {Cycle 10} STIS Sparse Field CTE test-internal {Cycle 10}

Jul 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001hst..prop.8910g&link_type=abstract

HST Proposal ID #8910

Physics

Hst Proposal Id #8910

Scientific paper

CTE measurements are made using the "sparse field test", along both the
serial and parallel axes. This program needs special commanding to
provide {a} off-center MSM positionings of some slits, and {b} the
ability to read out with any amplifier {A, B, C, or D}. All exposures
are internals.

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