Tracing and Mapping the Extraterrestrial Contamination in Impactites with Portable µ-XRF Instruments: Potentials and Real Time Field Testing at Rochechouart

Details Tracing and Mapping the Extraterrestrial Contamination in Impactites with Portable µ-XRF Instruments: Potentials and Real Time Field Testing at Rochechouart Tracing and Mapping the Extraterrestrial Contamination in Impactites with Portable µ-XRF Instruments: Potentials and Real Time Field Testing at Rochechouart

Sep 2009

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2009m%26psa..72.5062t&link_type=article

72nd Annual Meeting of the Meteoritical Society, held July 13-18, 2009 in Nancy, France. Published in Meteoritics and Planetary

Physics

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