Automatic test comes to focal plane array production

Details Automatic test comes to focal plane array production Automatic test comes to focal plane array production

Aug 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992spie.1683..136s&link_type=abstract

Proc. SPIE Vol. 1683, p. 136-143, Infrared Focal Plane Array Producibility and Related Materials, Raymond S. Balcerak; Paul W. P

Physics

Scientific paper

To meet the needs of military and commercial markets, the infrared focal
plane array industry must develop new, effective and low cost methods of
fabricating and testing imaging detectors. This paper describes Texas
Instruments new concepts in automated testing and cold probe technology
as they apply to volume production.

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