Visible Mueller matrix spectropolarimetry

Details Visible Mueller matrix spectropolarimetry Visible Mueller matrix spectropolarimetry

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121..156s&link_type=abstract

Proc. SPIE Vol. 3121, p. 156-160, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipm

Physics

Scientific paper

A Mueller matrix spectropolarimeter operating between 400- 900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro- optic dispersion of a spatial light modulator will be presented.

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