The STScI STIS Pipeline: Bias Level Correction

Details The STScI STIS Pipeline: Bias Level Correction The STScI STIS Pipeline: Bias Level Correction

May 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997stis.rept....9g&link_type=abstract

STIS Instrument Science Report 97-09, 19 pages

Physics

Hubble Space Telescope, Hst, Space Telescope Science Institute, Stis, Space Telescope Imaging Spectrograph

Scientific paper

The properties of the bias frame of the STIS SITe 1024x1024 CCD, including its serial and parallel overscan regions, are described. Overscan regions are listed for all supported binning factors. There are significant differences in the (2-D) behavior of the bias level in the sensitive region of the STIS CCD with respect to that found in the serial and parallel overscan regions, resulting in the necessity of an additional 2-D zero level correction. Flat fields taken with the (operational) amplifier D show an amplifier non-linearity: the bias level of a given row is found to be dependent on the signal in that row. Analysis of the right-hand side overscan region of flat field images shows that the bias value is depressed with respect to the nominal bias value by an amount proportional to the mean signal in the row. The dependence on signal level depends on the binning in the X direction of the CCD. The maximum dependence is found in the case of unbinned data, where the overscan bias level is depressed by 1 electron per (average) row signal of roughly 1380 electrons. For the majority of science observations, we recommend to perform overscan subtraction by a smooth, low-order fit to the bias level in the left-hand serial overscan. Such a fit will be insensitive to the "depression problem", since only a few rows will be affected in case of scientific observations. Observers will be able to estimate the effect of the "depression problem" from the parallel (virtual) overscan in raw, full-frame CCD images.

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