In Situ Lift-Out with a Focused-Ion-Beam/Scanning-Electron Microscope: A New Technique for Creating Transmission-Electron-Microscope Samples of Earth and Planetary Materials

Details In Situ Lift-Out with a Focused-Ion-Beam/Scanning-Electron Microscope: A New Technique for Creating Transmission-Electron-Microscope Samples of Earth and Planetary Materials In Situ Lift-Out with a Focused-Ion-Beam/Scanning-Electron Microscope: A New Technique for Creating Transmission-Electron-Microscope Samples of Earth and Planetary Materials

Mar 2006

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2006lpi....37.1441z&link_type=abstract

37th Annual Lunar and Planetary Science Conference, March 13-17, 2006, League City, Texas, abstract no.1441

Physics

1

Scientific paper

Here we describe a new technique for creating
transmission-electron-microscope samples of earth and planetary
materials.

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