Metrology for spatial interferometry III

Details Metrology for spatial interferometry III Metrology for spatial interferometry III

Oct 1996

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1996spie.2807..148g&link_type=abstract

Proc. SPIE Vol. 2807, p. 148-161, Space Telescopes and Instruments IV, Pierre Y. Bely; James B. Breckinridge; Eds.

Physics

Scientific paper

Very high resolution spatial interferometry requires picometer level 1D metrology, surface metrology and 3D metrology. The absolute distance measurements with accuracies of only 1 part in a million are required due to the careful design of spacecraft like the proposed Stellar Interferometry Mission, carrying high resolution stellar interferometers. An absolute calibration system for the surface gauge described in a previous paper is demonstrated. A self-calibrating absolute metrology system with a repeatability of 2 microns rms over a one-way distance of a meter is demonstrated. The accuracy calibration of this gauge is in progress. An auto-aligning, 3D metrology gauge is constructed using the sub-picometer linear metrology gauge described in earlier papers. Initial test results from this demonstration are presented.

Affiliated with

Also associated with

No associations

Rating

Metrology for spatial interferometry III does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Metrology for spatial interferometry III, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Metrology for spatial interferometry III will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1141791