STIS Sparse Field CTE test-internal {Cycle 12}

Details STIS Sparse Field CTE test-internal {Cycle 12} STIS Sparse Field CTE test-internal {Cycle 12}

Jul 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003hst..prop10026g&link_type=abstract

HST Proposal ID #10026

Physics

Hst Proposal Id #10026

Scientific paper

CTE measurements are made using the "internal sparse field test", along
the parallel axis. The "POS=" optional parameter, introduced during
cycle 11, is used to provide off-center MSM positionings of some slits.
All exposures are internals.

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