A measuring technology for fiber connector end surface

Details A measuring technology for fiber connector end surface A measuring technology for fiber connector end surface

Jan 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5633..615f&link_type=abstract

Advanced Materials and Devices for Sensing and Imaging II. Edited by Wang, Anbo; Zhang, Yimo; Ishii, Yukihiro. Proceedings of

Physics

Scientific paper

A non-contact optical microscopy system is described. It adopts basic Michelson structure to measure the characteristic of end surface of the fiber connector. We take use of the Fourier transform to process interference pattern. Getting the high information of two-dimension section picture. We take use of the First Derivative is extremum and Second Derivative is zero to detect the edge jump points. And we take use of Least Square Method etc. curve fitting method to describe the two-dimension section picture. We analyze the method to measure geometrical parameters of end surface. Then we can measure the characteristic of end surface. For example: the geometric parameters and roughness.

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