NICMOS Dither Test two-gyro mode

Details NICMOS Dither Test two-gyro mode NICMOS Dither Test two-gyro mode

Jul 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004hst..prop10447w&link_type=abstract

HST Proposal ID #10447

Physics

Hst Proposal Id #10447

Scientific paper

The accuracy of the combined dither and chop mode in NICMOS running in two-gyro mode is tested. Dithering permits the removal of dead or non-calibrated pixels on the detectors and improves the spatial sampling and the effects of detector non-uniformities. Chopping is used for mapping and background subtraction. The latter can involve large offsets in order to find blank sky. In this test we use the NIC-SPIRAL-DITH-CHOP pattern with a dither step of 1.5" and a chop of 100". The chop distance is small enough that a re-acquisition of the guide star is not required {chosen before larger chop distance because of time constraint}. NIC1 and NIC2 cameras are involved, where NIC2 is primary and NIC1 parallel.

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