Physics
Scientist
Technion-Israel Institute of Technology
Microelectronics Ctr. of North Carolina
Experimental and theoretical analysis of the contribution of the graded region to the current and RoA of HgCdTe diodes
Interface properties of various passivations of HgCdTe
Monolithic focal-plane cell in InSb
P-channel MIS double-metal process InSb monolithic unit cell for infrared imaging
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