Statistics – Applications
Scientist
Statistics
Applications
Scientist
Department of Electrical & Computer Engineering, Colorado State University
NSF ERC for Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado 80523, USA
Extremely compact capillary discharge-based soft x-ray lasers and their application to dense plasma diagnostics
Observation of a Multiply Ionized Plasma with Index of Refraction Greater than One
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