Jeff L. Metschuleit

Statistics – Methodology

Scientist

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Details Jeff L. Metschuleit Jeff L. Metschuleit

: Statistics
: Methodology

: Scientist
: Amber Engineering, Inc.

Affiliated with

Optimizing scanning array performance using gain normalization and timedelay and integrate pixel deselection during readout, hybrid, and focal plane testing

Statistics – Methodology

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Stability evaluation of staring InSb imagers

Physics

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Profile ID: LFWR-SCP-P-760829

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