Physics – Instrumentation and Detectors
Scientist
Physics
Instrumentation and Detectors
Scientist
NIMP Bucharest and University of Hamburg
Comparison of near-interface traps in Al$_2$O$_3$/4H-SiC and Al$_2$O$_3$/SiO$_2$/4H-SiC structures
Optimization of the Radiation Hardness of Silicon Pixel Sensors for High X-ray Doses using TCAD Simulations
Radiation Damage in Silicon Detectors Caused by Hadronic and Electromagnetic Irradiation
Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type silicon
Study of X-ray Radiation Damage in Silicon Sensors
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