Physics
Optics
Scientist
Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes
Ellipsometry with an undetermined polarization state
Mo/Si multilayer coating technology for EUVL: coating uniformity and time stability
Multilayer reflectance during exposure to EUV radiation
New PTB beamlines for high-accuracy EUV reflectometry at BESSY II
No associations
LandOfFree
Eric Louis does not yet have a rating. At this time, there are no reviews or comments for this scientist.
If you have personal experience with Eric Louis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eric Louis will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-P-268821