Reliability assessment of the Ommic DO1PH PHEMT power process

Details Reliability assessment of the Ommic DO1PH PHEMT power process Reliability assessment of the Ommic DO1PH PHEMT power process

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507..349p&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

Computer Science

Scientific paper

Reliability results, including storage (300°C, 168h) humidity
(85°C/85%RH, 1008h) and endurance (Tj=175°C, 4000h), are
presented for a 0.13 μm PHEMT power process. It is demonstrated that
under these stress conditions the OMMIC D01PH process is highly reliable

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