Re-programmable SEU immune rad-hard FPGA: test and burn-in strategy

Details Re-programmable SEU immune rad-hard FPGA: test and burn-in strategy Re-programmable SEU immune rad-hard FPGA: test and burn-in strategy

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507..109v&link_type=gif

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

Computer Science

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